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Journal of Electromagnetic Waves and Applications Volume 22, 2008 - Issue 17-18
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Articles

Susceptibility of Microcontroller Devices due to Coupling Effects Under Narrow-Band High Power Electromagnetic Waves by Magnetron

J. I. Hong Department of Electrical Engineering, INHA University, 253 Yonghyun-Dong Nam Incheon 402-751, Korea
,
S. M. Hwang Department of Electrical Engineering, INHA University, 253 Yonghyun-Dong Nam Incheon 402-751, Korea
&
C. S. Huh Department of Electrical Engineering, INHA University, 253 Yonghyun-Dong Nam Incheon 402-751, Korea
Pages 2451-2462 | Published online: 03 Apr 2012

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Read on this site (4)

S. M. Han, J. J. Bang & C. S. Huh. (2011) THE VALIDATION AND CORRECTION OF THE APPROXIMATION EQUATION USED FOR THE DIRECT CALCULATION OF THE EFFECTIVE FREQUENCIES OF EMP WAVEFORMS. Journal of Electromagnetic Waves and Applications 25:10, pages 1412-1421.
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S. M. Hwang, J. I. Hong, S.-M. Han, C. S. Huh & J.-S. Choi. (2010) Susceptibility and Coupled Waveform of Microcontroller Device by Impact of UWB-HPEM. Journal of Electromagnetic Waves and Applications 24:8-9, pages 1059-1067.
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S.-M. Han, C. S. Huh & J. S. Choi. (2009) A New Method for the Compensation of Coaxial Cable Loss While Measuring EMP Signals. Journal of Electromagnetic Waves and Applications 23:14-15, pages 1991-2000.
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J. I. Hong, S. M. Hwang & C. S. Huh. (2009) Susceptibility of CMOS IC Devices Under Narrow-Band High Power Electromagnetic Waves by Magnetron. Journal of Electromagnetic Waves and Applications 23:5-6, pages 571-582.
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Articles from other publishers (3)

V. A. Vdovin, R. A. Denisov, S. A. Sapetskii & V. A. Cherepenin. (2023) Technology of Experiments of Non-Thermal Effect of Powerful Electromagnetic Pulses on Natural and Artificial Environments. Journal of Communications Technology and Electronics 68:9, pages 995-1001.
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Hui Jing, Zongnan Miao, Zhong Zeng, Hui Liu, Shengtai Zhou, Huawei Zou & Mei Liang. (2021) Carbonization of Graphene-Doped Isocyanate-Based Polyimide Foams to Achieve Carbon Foams with Excellent Electromagnetic Interference Shielding Performance. Materials 14:24, pages 7551.
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D.S. Kim, J.H. Choi, N.C. Park, S.I. Chan & Y.C. Jeong. (2018) Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. Microelectronics Reliability 88-90, pages 411-417.
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