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Philosophical Magazine A Volume 50, 1984 - Issue 1
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Original Articles

On the origin of the additional electron diffraction spots from epitaxial (111) Si single-crystal films

Y. Lereah Department of Electronic Devices and Materials, Faculty of Engineering, Tel-Aviv University, Ramat-Aviv, Tel-Aviv, 69978, Israel
&
E. Grünbaum Department of Electronic Devices and Materials, Faculty of Engineering, Tel-Aviv University, Ramat-Aviv, Tel-Aviv, 69978, Israel
Pages 1-7 | Received 15 Nov 1982, Accepted 11 Nov 1983, Published online: 04 Oct 2006

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