37
Views
6
CrossRef citations to date
0
Altmetric
Original Articles

On the origin of the additional electron diffraction spots from epitaxial (111) Si single-crystal films

&
Pages 1-7 | Received 15 Nov 1982, Accepted 11 Nov 1983, Published online: 04 Oct 2006

References

  • Cherns , D. 1974 . Phil. Mag. , 30 : 549
  • Dickson , E. W. and Pashley , D. W. 1962 . Phil. Mag. , 7 : 1315
  • Hirsch , P. B. , Kelly , A. and Menter , J. W. 1955 . Proc. phys. Soc. B , 68 : 1132
  • Jagodzinski , H. 1949 . Acta crystallogr. , 2 : 208
  • Lereah , Y. and Grünbaum , E. 10th Id. Congr. Eletron Microsc. pp. 381 part B
  • Ourmazd , A. , Anstis , G. R. and Hirsch , P. B. 1984 . Phil. Mag. A , 48 : 139
  • Pashley , D. W. and Stowell , M. J. 1963 . Phil. Mag. , 8 : 1605
  • Tan , T. Y. , Föll , H. and Hu , S. M. 1981 . Phil. Mag. A , 44 : 127

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.