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Science and Technology of Advanced Materials: Methods Volume 3, 2023 - Issue 1
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Materials data analysis and utilization

Cylindrically symmetric rotating crystals observed in crystallization process of InSiO film

Bo Daa Center for Basic Research on Materials, National Institute for Materials Science, Tsukuba, JapanCorrespondence[email protected]
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Long Chengb Department of Physics, University of Science and Technology of China, Hefei, ChinaORCID Iconhttps://orcid.org/0000-0001-9599-2257View further author information
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Xun Liua Center for Basic Research on Materials, National Institute for Materials Science, Tsukuba, Japan;b Department of Physics, University of Science and Technology of China, Hefei, ChinaView further author information
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Kunji Shigetoc Electron Microscope Systems Design Department, Hitachi High-Tech Corporation, Hitachinaka, JapanView further author information
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Kazuhito Tsukagoshid Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, Tsukuba, JapanView further author information
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Toshihide Nabatamed Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, Tsukuba, JapanView further author information
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Zejun Dingb Department of Physics, University of Science and Technology of China, Hefei, ChinaView further author information
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Yang Sune Department of Physics, Xiamen University, Xiamen, ChinaView further author information
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Jin Huf Department of Physics and Institute for Nanoscience and Engineering, University of Arkansas, Fayetteville, AR, USAView further author information
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Jiangwei Liug Research Center for Electronic and Optical Materials, National Institute for Materials Science, Tsukuba, JapanView further author information
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Daiming Tangd Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, Tsukuba, JapanORCID Iconhttps://orcid.org/0000-0001-7136-7481View further author information
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Han Zhanga Center for Basic Research on Materials, National Institute for Materials Science, Tsukuba, JapanView further author information
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Zhaoshun Gaoh Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, P.R. ChinaView further author information
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Hongxuan Guoi Key Laboratory of MEMS of Ministry of Education, School of Electronic Science and Engineering, Southeast University, Nanjing, People’s Republic of ChinaView further author information
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Hideki Yoshikawaa Center for Basic Research on Materials, National Institute for Materials Science, Tsukuba, JapanView further author information
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Shigeo Tanumaj Research Network and Facility Services Division, National Institute for Materials Science, Tsukuba, JapanView further author information
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Article: 2230870 | Received 22 Oct 2022, Accepted 25 Jun 2023, Published online: 13 Jul 2023

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