Advanced search
Publication Cover
Ferroelectrics Volume 152, 1994 - Issue 1
Submit an article Journal homepage
36
Views
33
CrossRef citations to date
0
Altmetric
Original Articles

Effect of electrodes on the ferroelectric properties of pulsed-laser ablation-deposited PbZrXTi1-xO3 thin film capacitors

D J. Lichtenwalner Department of Materials Science and Engineering, North Carolina State University, Raleigh, 27695, NC
,
R. Dat Department of Materials Science and Engineering, North Carolina State University, Raleigh, 27695, NC
,
O. Auciello MCNC, Center for Microelectronic Systems Technology, Research Triangle Park, NC 27709–2889
&
A. I. Kingon Department of Materials Science and Engineering, North Carolina State University, Raleigh, 27695, NC
Pages 97-102 | Received 09 Aug 1993, Published online: 25 Feb 2011

Citations (33)

Keep up to date with the latest research on this topic with citation updates for this article.

Subscribe to citation updates

Read on this site (11)

V.S. Vidyarthi , G. Suchaneck, M. Reibold, R. Grötzschel & G. Gerlach. (2009) A 150 mm Wafer Technology for Highly (111) Oriented Pb(Zr,Ti)O3 Films on BaPbO3/Pt Electrode. Ferroelectrics 390:1, pages 145-152.
Read now
Bing Wang, Kin Wing Kwok, Helen Lai Wah Chan, Chung Loong Choy & Kwok Ying Tong. (2001) Effect of RuO2 electrode on polarization fatigue resistance of PbZr0.52Ti0.48O3 thin films. Ferroelectrics 260:1, pages 207-212.
Read now
I. Stolichnov, A. Tagantsev, N. Setter, J.S. Cross, M. Fujiki & M. Tsukada. (1999) Degradation of asymmetrical Pt/SRO/PLZT/Pt capacitors: Role of Pt and oxide electrodes. Integrated Ferroelectrics 26:1-4, pages 311-321.
Read now
Geun Jo Han, Cheol-Woong Yang & Jaichan Lee. (1999) Effect of (La, Sr)CoO3 seed layer on the reliability of Pb(Zr, Ti)O3 capacitors. Integrated Ferroelectrics 25:1-4, pages 341-350.
Read now
Hiroshj Masumoto, Stephane Hiboux & Paul Muralt. (1999) Preparation of La1−xSrxCoO3 electrodes for ferroelectric thin films by rf magnetron sputtering. Ferroelectrics 225:1, pages 335-341.
Read now
Chang-Beom Eom, RajeshA. Rao, Qing Gan, Kiyotaka Wasa & D.J. Werder. (1998) Single crystal thin films of conductive oxides SrRuO3 and ferroelectric heterostructures. Integrated Ferroelectrics 21:1-4, pages 251-261.
Read now
M. Brazier, S. Mansour, E. Paton & M. Mcelfresh. (1997) Effects of finite electrical resistance on the polarization measurement of ferroelectric capacitors. Integrated Ferroelectrics 18:1-4, pages 79-89.
Read now
X.X. Qu & F. Lévy. (1995) Textured ferroelectric SbNbO4 thin films deposited by ion-beam sputtering. Ferroelectrics Letters Section 20:3-4, pages 83-88.
Read now
C.J. Rawn, M.N. Orr, R.N. Vogt, D.P. Birnie Iii & R.D. Schrimpf. (1995) Effect of RuOx bottom electrode annealing temperature on sol-gel derived PZT capacitors. Integrated Ferroelectrics 10:1-4, pages 309-318.
Read now
J. Lee, R. Ramesh, V.G. Keramidas & O. Auciello. (1995) Ferroelectric properties and reliability of La-Sr-Co-O/Pb-La-Zr-Ti-O/La-Sr-Co-O heterostructures on si for non-volatile memory applications. Integrated Ferroelectrics 9:4, pages 317-333.
Read now
R. Dat, D.J. Lichtenwalner, O. Auciello & A.I. Kingon. (1995) Lead zirconate titanate ferroelectric capacitors produced on sapphire and gallium arsenide substrates. Integrated Ferroelectrics 8:3-4, pages 309-316.
Read now

Articles from other publishers (22)

Eun Mi Lee, Yoonho Ahn & Jong Yeog Son. (2020) Effects of Mn doping on BaTiO3 thin films grown on highly oriented pyrolytic graphite substrates. Current Applied Physics 20:6, pages 755-759.
Crossref
Rajesh Kumar Jha, Prashant Singh, Upendra Kashniyal, Manish Goswami & B. R. Singh. (2020) Impact of HfO2 buffer layer on the electrical characteristics of ferroelectric/high-k gate stack for nonvolatile memory applications. Applied Physics A 126:6.
Crossref
Jijie Huang, Xingyao Gao, Judith L. MacManus-Driscoll & Haiyan Wang. 2019. Nanostructures in Ferroelectric Films for Energy Applications. Nanostructures in Ferroelectric Films for Energy Applications 19 39 .
Andreas Klein, Christian Lohaus, Patrick Reiser, Lucangelo Dimesso, Xiucai Wang & Tongqing Yang. (2017) Energy band alignment of antiferroelectric (Pb,La)(Zr,Sn,Ti)O 3. Applied Surface Science 407, pages 99-104.
Crossref
Andreas Klein. (2016) Interface Properties of Dielectric Oxides. Journal of the American Ceramic Society 99:2, pages 369-387.
Crossref
Zhongli Zhang, Jifan Hu, Zhijun Xu, Hongwei Qin, Li Sun, Feng Gao, Yongjia Zhang & Minhua Jiang. (2011) Room-temperature ferromagnetism and ferroelectricity in nanocrystalline PbTiO3. Solid State Sciences 13:7, pages 1391-1395.
Crossref
F Chen, R Schafranek, S Li, W B Wu & A Klein. (2010) Energy band alignment between Pb(Zr,Ti)O 3 and high and low work function conducting oxides—from hole to electron injection . Journal of Physics D: Applied Physics 43:29, pages 295301.
Crossref
Robert Schafranek, Judith Schaffner & Andreas Klein. (2010) In situ photoelectron study of the (Ba,Sr)TiO3/RuO2 contact formation. Journal of the European Ceramic Society 30:2, pages 187-192.
Crossref
P.A. Lane, M.J. Crosbie, P.J. Wright, P.P. Donohue, P.J. Hirst, C.L. Reeves, C.J. Anthony, J.C. Jones, M.A. Todd & D.J. Williams. (2003) The Metal–Organic Chemical Vapor Deposition of Lanthanum Nickelate Electrodes for Use in Ferroelectric Devices. Chemical Vapor Deposition 9:2, pages 87-92.
Crossref
W. C. Goh, S. Y. Xu, S. J. Wang & C. K. Ong. (2001) Microstructure and growth mode at early growth stage of laser-ablated epitaxial Pb(Zr0.52Ti0.48)O3 films on a SrTiO3 substrate. Journal of Applied Physics 89:8, pages 4497-4502.
Crossref
Deborah J. Taylor. 2001. Frontiers of Thin Film Technology. Frontiers of Thin Film Technology 435 463 .
Geunjo Han & J. Lee. (2000) The effect of metallic oxide layer on reliability of lead zirconate titante thin film capacitors. Surface and Coatings Technology 131:1-3, pages 542-546.
Crossref
I. Stolichnov, A. Tagantsev, N. Setter, J. S. Cross & M. Tsukada. (1999) Top-interface-controlled switching and fatigue endurance of (Pb,La)(Zr,Ti)O3 ferroelectric capacitors. Applied Physics Letters 74:23, pages 3552-3554.
Crossref
Orlando AucielloChris M. FosterRammamoorthy Ramesh. (1998) PROCESSING TECHNOLOGIES FOR FERROELECTRIC THIN FILMS AND HETEROSTRUCTURES. Annual Review of Materials Science 28:1, pages 501-531.
Crossref
Seung-Hyun Kim, Yong-Soo Choi, Chang-Eun Kim & Doo-Young Yang. (1998) The effects of PbTiO3 thin template layer and Pt/RuO2 hybrid electrode on the ferroelectric properties of sol-gel derived PZT thin film. Thin Solid Films 325:1-2, pages 72-78.
Crossref
Lirong Zheng, Chenglu Lin, Huaping Xu, Shichang Zou & Okuyama Masanori. (1997) Leakage behavior and distortion of the hysteresis loop in ferroelectric thin films. Science in China Series E: Technological Sciences 40:2, pages 126-134.
Crossref
Lirong Zheng, Chenglu Lin, W-ping Xu & Masanori Okuyama. (1996) Drift and deformation of the hysteresis curve in thin film ferroelectric capacitors with conductance. Journal of Physics D: Applied Physics 29:7, pages 2020-2024.
Crossref
Lirong Zheng, Chenglu Lin & Tso-Ping Ma. (1996) Current - voltage characteristic of asymmetric ferroelectric capacitors. Journal of Physics D: Applied Physics 29:2, pages 457-461.
Crossref
M. V. Raymond, H. N. Al-Shareef, B. A. Tuttle, D. DiMos & J. T. Evans. (2011) Rf Magnetron Sputter-Deposition of La 0.5 Sr 0.5 CoO 3 //Pt Composite Electrodes for Pb(Zr, Ti)O 3 Thin Film Capacitors . MRS Proceedings 433.
Crossref
Lirong Zheng, W-Ping Xu, Pingxiong Yang & Chenglu Lin. (1996) Distortion of polarization hysteresis in ferroelectric thin films with conductance. Distortion of polarization hysteresis in ferroelectric thin films with conductance.
H.N. Al-Shareef, K.R. Bellur, O. Auciello & A.I. Kingon. (1995) Phase evolution and annealing effects on the electrical properties of Pb(Zr0.53Ti0.47)O3 thin films with RuO2 electrodes. Thin Solid Films 256:1-2, pages 73-79.
Crossref
H.N. Al-Shareef, K.R. Bellur, O. Auciello, X. Chen & A.I. Kingon. (1994) Effect of composition and annealing conditions on the electrical properties of Pb(ZrxTi1−x)O3 thin films deposited by the sol-gel process. Thin Solid Films 252:1, pages 38-43.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.